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Proceedings Paper

Design and performance of the 2-ID-B scanning x-ray microscope
Author(s): Ian McNulty; Sean P. Frigo; Cornelia C. Retsch; Yuxin Wang; Yipeng Feng; Yonglin Qian; Emil M. Trakhtenberg; Brian Tieman; B.-C. Cha; K. Goetze; Timothy M. Mooney; Waleed S. Haddad
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Paper Abstract

We have constructed a high resolution scanning x-ray microscopy at the 2-ID-B beamline at the Advanced Photon Source for 1-4 keV x-ray imaging and microspectroscopy experiments. The microscope uses a Fresnel zone plate to focus coherent x-ray undulator radiation to a 150 nm focal spot on a sample. The spectral flux in the focus is 108 ph/s/0.1 percent BW. X- ray photons transmitted by the sample are detected by an avalanche photodiode as the sample is scanned to form an absorption image. The sample stage has both coarse and fine translation axes for raster scanning and a rotation axis for microtomography experiments. The incident x- ray beam energy can also be scanned and a rotation axis for microtomography experiments. The incident x-ray beam energy can also be scanned via the 2-ID-B monochromator while the sample is kept in focus to record spatially resolved absorption spectra. We have measured the performance of the instrument with various test objects. THe microscope hardware, software, and performance are discussed in this paper.

Paper Details

Date Published: 6 November 1998
PDF: 8 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330333
Show Author Affiliations
Ian McNulty, Argonne National Lab. (United States)
Sean P. Frigo, Argonne National Lab. (United States)
Cornelia C. Retsch, Argonne National Lab. (United States)
Yuxin Wang, Argonne National Lab. (United States)
Yipeng Feng, Argonne National Lab. (United States)
Yonglin Qian, Argonne National Lab. (United States)
Emil M. Trakhtenberg, Argonne National Lab. (United States)
Brian Tieman, Argonne National Lab. (United States)
B.-C. Cha, Argonne National Lab. (United States)
K. Goetze, Argonne National Lab. (United States)
Timothy M. Mooney, Argonne National Lab. (United States)
Waleed S. Haddad, Lawrence Livermore National Lab. (United States)

Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

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