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Proceedings Paper

Performance of the XMM EPIC MOS CCD detectors
Author(s): Alexander T. Short; Adam Keay; Martin J. L. Turner
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Paper Abstract

Measurements made during the selection and evaluation of flight CCD detectors for the XMM EPIC MOS cameras have demonstrated near Fano limited resolution at x-ray energies above approximately 3keV. At lower energies some devices exhibit a fractional charge loss which is believed to be due to recombination at the epitaxy/oxide interface. This has been modeled through a Monte-Carlo simulation by assuming that the pinning implant in the etched electrode structure can cause electrons to flow to the front surface, rather than to the buried channel. In spite of this charge loss, spectral response may be characterized using a double Gaussian with residuals of < 5 percent. Quantum efficiency has been measured using a lithium drifted silicon reference detector and these measurements combined with analytical and Monte Carlo simulation, event size ratios and cosmic ray detection, all give a value for the effective depletion depth of 30 to 35 micrometers .

Paper Details

Date Published: 10 November 1998
PDF: 15 pages
Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); doi: 10.1117/12.330276
Show Author Affiliations
Alexander T. Short, Univ. of Leicester (United Kingdom)
Adam Keay, Univ. of Leicester (United Kingdom)
Martin J. L. Turner, Univ. of Leicester (United Kingdom)


Published in SPIE Proceedings Vol. 3445:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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