Share Email Print
cover

Proceedings Paper

FUV interferometric spectroscopy
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Dispersive interferometric spectroscopy using all-reflective optical elements can be applied to the far UV bandpass to provide very high spectroscopic resolution in a highly compact optical configuration. Dispersive interferometric spectroscopy is therefore well suited for UV and optical space-flight missions. We describe attributes of interferometric spectroscopy and show results from a laboratory demonstration of a high-resolution FUV dispersive interferometric spectrometer.

Paper Details

Date Published: 10 November 1998
PDF: 3 pages
Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); doi: 10.1117/12.330268
Show Author Affiliations
Jerry Edelstein, Univ. of California/Berkeley (United States)
Timothy N. Miller, Univ. of California/Berkeley (United States)


Published in SPIE Proceedings Vol. 3445:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

© SPIE. Terms of Use
Back to Top