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Proceedings Paper

Multiple layer reflectance and spectroscopic calibration for remote sensing spectral imagers
Author(s): William F. Seng; Bruce Rafert; Leonard John Otten; Andrew D. Meigs
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Paper Abstract

UV-VIS-NIR ratiometric reflectance data was obtained for several commonly utilized remote sensing calibration standards used in Fourier Transform Hyperspectral Imaging. We found that single layer reflectance depends on the degree of translucency and hence on the particular choice of background material, from which multiple layer reflectance and extracted absorption and scattering curves logically follow. These data are given as a function of incident wavelength for each calibration standard. Because optical properties are determined by the combination of scattering and absorption, we deconvolved their effects on each material's spectrum.

Paper Details

Date Published: 4 December 1998
PDF: 6 pages
Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); doi: 10.1117/12.328671
Show Author Affiliations
William F. Seng, Michigan Technological Univ. (United States)
Bruce Rafert, Michigan Technological Univ. (United States)
Leonard John Otten, Kestrel Corp. (United States)
Andrew D. Meigs, Kestrel Corp. (United States)


Published in SPIE Proceedings Vol. 3491:
1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications

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