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Proceedings Paper

High precision remote sensing of microsphere distortion
Author(s): Moses Fayngold
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Paper Abstract

A theoretical model is presented for detecting very small (less than size of an atom) distortions of a dielectric microsphere at distances beyond the resolution limit of an imaging optical system. The method described involves illumination of the object with the circularly polarized light and the ellipsometry of the backscattered light. Comparing the results for right and left polarizations of the incident light gives also information of the spatial attitude (orientation) of the deformed sphere.

Paper Details

Date Published: 4 December 1998
PDF: 5 pages
Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); doi: 10.1117/12.328661
Show Author Affiliations
Moses Fayngold, Polytechnic Univ. (United States)


Published in SPIE Proceedings Vol. 3491:
1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications
George A. Lampropoulos; Roger A. Lessard, Editor(s)

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