Share Email Print
cover

Proceedings Paper

Toroidal surface profilometries through Ronchi deflectrometry: constancy under rotation of the sample
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Toroidal surface profilometries have been obtained using the well-known Ronchi deflectometry arrangement. From the intensity pattern formed when sampling the wavefront with a Ronchi ruling, the direction of the normal vectors to the toroidal surface at a set of positions is obtained, allowing the measurement of the radius of curvature along the surface's principal meridians. Results are presented for a toroidal surface with its principal meridian of minimum radius oriented at 0 degree(s), 30 degree(s), 60 degree(s) and 90 degree(s) from X axis, keeping the lines on the Ronchi ruling along X and Y axes. The results obtained at different orientations are highly coincident, showing the stability of deflectrometric measurements under rotation of the sample in the case the surface doesn't have rotational symmetry. Influence of little angular errors in the placement of the principal meridians on the quality of the measurements is also studied, yielding that if angular errors in the placement of the principal meridians are up to 5 degree(s), the error introduced is the 0.1% of the measured value.

Paper Details

Date Published: 4 December 1998
PDF: 7 pages
Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); doi: 10.1117/12.328653
Show Author Affiliations
Josep Arasa, Technical Univ. of Catalunya (Spain)
Santiago Royo, Technical Univ. of Catalunya (Spain)
Carlos Pizarro, Technical Univ. of Catalunya (Spain)


Published in SPIE Proceedings Vol. 3491:
1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications
George A. Lampropoulos; Roger A. Lessard, Editor(s)

© SPIE. Terms of Use
Back to Top