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Proceedings Paper

Near-field scattering optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides
Author(s): Roderick S. Taylor; Kurt E. Leopold; Jeffrey W. Fraser; Yan Feng; Margaret Buchanan
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Paper Abstract

Near-field probe apertures are created for bent and chemically etched fibers using a technique based upon controlled compression of a malleable Au coating. Reproducible, near-circular apertures free of protrusions are obtained. The probes are first characterized using scanning electron microscopy and a near-field test pattern, then are used to perform high-resolution beam scans of near- infrared diode lasers and optical waveguides.

Paper Details

Date Published: 4 December 1998
PDF: 6 pages
Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); doi: 10.1117/12.328638
Show Author Affiliations
Roderick S. Taylor, National Research Council Canada (Canada)
Kurt E. Leopold, National Research Council Canada (Canada)
Jeffrey W. Fraser, National Research Council Canada (Canada)
Yan Feng, National Research Council Canada (Canada)
Margaret Buchanan, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 3491:
1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications
George A. Lampropoulos; Roger A. Lessard, Editor(s)

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