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Proceedings Paper

A theoretical assessment of optical reflectometry for film chemical sensors
Author(s): Augusto Garcia-Valenzuela; J. M. Saniger-Blesa; C. Garcia-Segundo
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Paper Abstract

We investigate theoretically the limits to the resolution imposed by the fundamental optical noises in film-based chemical sensors interrogated by optical reflectometry. We suggest a dynamic reflectometry approach as a possible technique to achieve the ultimate resolution. We find that a theoretical resolution around 1010 absorbed analyte molecules/cm2 is possible in different cases. In the case of conducting films appreciably lower values may be possible.

Paper Details

Date Published: 4 December 1998
PDF: 6 pages
Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); doi: 10.1117/12.328628
Show Author Affiliations
Augusto Garcia-Valenzuela, Univ. Nacional Autonoma de Mexico (Mexico)
J. M. Saniger-Blesa, Univ. Nacional Autonoma de Mexico (Mexico)
C. Garcia-Segundo, Univ. Nacional Autonoma de Mexico (Mexico)


Published in SPIE Proceedings Vol. 3491:
1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications
George A. Lampropoulos; Roger A. Lessard, Editor(s)

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