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Proceedings Paper

Dynamic and polychromatic SPR-leaky mode spectroscopy with Teflon AF films on silver for chemo-sensing
Author(s): R. P. Podgorsek; Hilmar Franke; Serge Caron; Pierre Galarneau
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Paper Abstract

The reflectivity of a polymer film on top of a thin metal layer is usually recorded for a fixed wavelength and the TM polarization as a function of the angle of incidence. This angular spectrum contains the surface plasmon resonance due to the metal layer and the leaky modes caused by the waveguide resonances of the polymer film. Here we investigated the reflectivity spectrum of such a multilayer for a white light source as a function of the wavelength at a constant angle of incidence. The leaky mode resonances on the wavelength scale have been detected. Dynamic measurements of the reflectivity of such a multilayer at constant angle and constant wavelength have been demonstrated for vapors of Toluene as an example. The realization of compact and simple devices using this technique is possible.

Paper Details

Date Published: 4 December 1998
PDF: 6 pages
Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); doi: 10.1117/12.328626
Show Author Affiliations
R. P. Podgorsek, Univ. Duisburg (Germany)
Hilmar Franke, Univ. Duisburg (Germany)
Serge Caron, INO (Canada)
Pierre Galarneau, INO (Canada)


Published in SPIE Proceedings Vol. 3491:
1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications
George A. Lampropoulos; Roger A. Lessard, Editor(s)

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