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Proceedings Paper

Backscatter ultraviolet instrument solar diffuser degradation
Author(s): Glen Jaross; Richard P. Cebula; Matthew DeLand; K. Steinfeld; Richard D. McPeters; Ernest Hilsenrath; Arlin J. Krueger
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Paper Abstract

All but one of the backscatter UV (BUV) instruments have used solar reflective diffusers made of ground aluminum to maintain instrument calibration after launch. These diffusers have been sued throughout mission life-times, which range from less than 1 years to over 14 years. Means for monitoring diffuser reflectance include mechanisms on the instruments as well as methods to infer reflectance using earth radiance data. We compare changes in diffuser reflectance for the various instruments and find some common behavior as well as significant differences. Changes which appear to occur at different rates are actually quite similar when corrections are made for the amount and direction of incident solar irradiation. However, a class of instruments, the SBUV/2, has significantly lower degradation rates. We find, as have previous authors, that spacecraft self-contamination is the most likely cause of diffuser changes and observed differences. Observed changes suggest that contaminant layer thickness is the main reflectance degradation mechanism in the first few years of operation.

Paper Details

Date Published: 27 October 1998
PDF: 13 pages
Proc. SPIE 3427, Optical Systems Contamination and Degradation, (27 October 1998); doi: 10.1117/12.328514
Show Author Affiliations
Glen Jaross, Raytheon STX Corp. (United States)
Richard P. Cebula, Raytheon STX Corp. (United States)
Matthew DeLand, Raytheon STX Corp. (United States)
K. Steinfeld, Raytheon STX Corp. (United States)
Richard D. McPeters, NASA Goddard Space Flight Ctr. (United States)
Ernest Hilsenrath, NASA Goddard Space Flight Ctr. (United States)
Arlin J. Krueger, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 3427:
Optical Systems Contamination and Degradation
Philip T. C. Chen; William E. McClintock; Gary J. Rottman, Editor(s)

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