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Proceedings Paper

Spectralon diffusers used as in-flight optical calibration hardware
Author(s): Beatrice Chommeloux; Gilles Baudin; Georges Gourmelon; Jean-Loup Bezy; Carina Van Eijk-Olij; Jos Groote Schaarsberg; Henri G.C. Werij; Erik Zoutman
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Paper Abstract

The medium resolution imaging spectrometer (MERIS), developed under European Space Agency (ESA) contract, for the Envisat 1 Polar Orbit Earth Mission belongs to a new generation of Ocean Color sensors which aim to improve the knowledge of some crucial processes of our planet. The instrument currently in the final stages of development is built by an international team led by AEROSPATIALE under ENVISAT prime contractor-ship of DORNIER. MERIS is a 'pushbroom' type instrument which measures the radiance of the Earth in 15 programmable spectral bands between 390 nm and 1040 nm over a 1150 km swath width. During the duration of the MERIS mission, radiometric in-flight calibration sequences are carried on a regular basis by the observation of Spectralon diffusers illuminated by the sun. The high accuracy required over the 4 years mission duration necessitates the precise knowledge of the calibration reference and the stability of the reference over the mission has to be controlled. This presentation details the influence of cleaning procedures on optical stability of the Spectralon flat plate diffusers calibration reference under space conditions and sun illumination. This paper will also define the BRDF characterization performances achieved with the Flight Model flat plate diffusers following implementation of the selected cleaning procedure.

Paper Details

Date Published: 27 October 1998
PDF: 12 pages
Proc. SPIE 3427, Optical Systems Contamination and Degradation, (27 October 1998); doi: 10.1117/12.328509
Show Author Affiliations
Beatrice Chommeloux, Aerospatiale (France)
Gilles Baudin, Aerospatiale (France)
Georges Gourmelon, European Space Agency/ESTEC (Netherlands)
Jean-Loup Bezy, European Space Agency/ESTEC (Netherlands)
Carina Van Eijk-Olij, TNO Institute of Applied Physics (Netherlands)
Jos Groote Schaarsberg, TNO Institute of Applied Physics (Netherlands)
Henri G.C. Werij, TNO Institute of Applied Physics (Netherlands)
Erik Zoutman, TNO Institute of Applied Physics (Netherlands)


Published in SPIE Proceedings Vol. 3427:
Optical Systems Contamination and Degradation
Philip T. C. Chen; William E. McClintock; Gary J. Rottman, Editor(s)

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