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Proceedings Paper

Light reflection from a porous surface where the size of the pore is near the wavelength
Author(s): Vladimir Pshenitsin; Vadim Antonov; Alexei L. Diikov
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Paper Abstract

The effipsometry parameters is calculated for the light reflection from porous surface with the pores which go vertically in the volume and have transverse size near the wavelength, the longitudinal size much more the wavelength and the size ofthe width ofthe partition much less the wavelength. The pore is considered as the waveguide and the porous surface is appcoximated by the periOdiCal system of the coupled vertical waveguides. The results of calculations show that the porous siructures with the pore size near the wavelength can redistrib.. ute mirror component ofreflected energy sufficiently increasing it in the nanow region ofangles of incidence. Keywords: reflection, scattering, porous surfaces, ellipsometry, rough surfaces

Paper Details

Date Published: 30 October 1998
PDF: 6 pages
Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328455
Show Author Affiliations
Vladimir Pshenitsin, State Univ. for Water Communications (Russia)
Vadim Antonov, Institute of Theoretical Astronomy (Russia)
Alexei L. Diikov, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 3426:
Scattering and Surface Roughness II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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