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Proceedings Paper

Detection of subsurface defects
Author(s): Zu-Han Gu; Zong Qi Lin; Michel A. Josse
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Paper Abstract

We present the experimental results of the detection of subsurface defects which show that the memory effect (or the far-field correlation function) of speckle patterns is sensitive to a small local change under the rough surface geometry. We envision this property can be applied to inspection of a target buried in the background by speckle mapping.

Paper Details

Date Published: 30 October 1998
PDF: 7 pages
Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328453
Show Author Affiliations
Zu-Han Gu, Surface Optics Corp. (United States)
Zong Qi Lin, Surface Optics Corp. (United States)
Michel A. Josse, CEA/Cesta (France)

Published in SPIE Proceedings Vol. 3426:
Scattering and Surface Roughness II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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