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Proceedings Paper

Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces
Author(s): Elena I. Chaikina; Pedro Negrete-Regagnon; Gabriel C. Martinez-Niconoff; Eugenio R. Mendez
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Paper Abstract

An experimental investigation of the hemispherical distribution of the light scattered by randomly rough isotropic dielectric surfaces is presented. The surfaces, whose profiles constitute good approximations to Gaussian random processes with Gaussian correlation functions are fabricated in photoresist. The substrates employed in the fabrication of the samples consist of thick parallel plates of filter glass that absorb the incident light and whose refractive index is close to that of photoresist. This allows us to approximate experimentally a situation in which the light is scattered by a randomly rough interface separating two semi-infinite dielectric media. The results display features that can be attributed to multiple scattering. In particular, a well-defined enhanced backscattering peak is observed in both, the co- and cross-polarized scattering measurements.

Paper Details

Date Published: 30 October 1998
PDF: 7 pages
Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328449
Show Author Affiliations
Elena I. Chaikina, CICESE/Fisica Aplicada (Mexico)
Pedro Negrete-Regagnon, CICESE/Fisica Aplicada (Mexico)
Gabriel C. Martinez-Niconoff, CICESE/Fisica Aplicada (Mexico)
Eugenio R. Mendez, CICESE/Fisica Aplicada (Mexico)


Published in SPIE Proceedings Vol. 3426:
Scattering and Surface Roughness II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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