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Proceedings Paper

Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation
Author(s): Thomas Fricke-Begemann; Frank Beyrau; Gerd Guelker; Klaus D. Hinsch; Peter Jauschke; Karin Wolff
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Paper Abstract

The decorrelation of the characteristic speckle pattern, produced by the scattering of coherent light from a random rough surface, is used to monitor changes in the microtopography of the surface. In a basic optical setup minute alterations down to a few nanometers can be measured. To enlighten the basic relations between the speckle field decorrelation and the surface changes a theoretical model is developed, numerical calculations are carried out and comparisons with high resolution AFM measurements on two frozen states of a surface process are undertaken. Whereas the reproducibility of the AFM measurement turns out to be not precise enough to measure nanometer changes on a micrometer scale rough surface, the theoretical model is consistent with results gained from experimental variation of wavelength and angle of illumination and a-priori knowledge about the surface. It is then used to obtain information about magnitude, time constants and statistical parameters of a corrosion process.

Paper Details

Date Published: 30 October 1998
PDF: 11 pages
Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328445
Show Author Affiliations
Thomas Fricke-Begemann, Carl von Ossietzky Univ. Oldenburg (Germany)
Frank Beyrau, Carl von Ossietzky Univ. Oldenburg (Germany)
Gerd Guelker, Carl von Ossietzky Univ. Oldenburg (Germany)
Klaus D. Hinsch, Carl von Ossietzky Univ. Oldenburg (Germany)
Peter Jauschke, Carl von Ossietzky Univ. Oldenburg (Germany)
Karin Wolff, Carl von Ossietzky Univ. Oldenburg (Germany)

Published in SPIE Proceedings Vol. 3426:
Scattering and Surface Roughness II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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