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Proceedings Paper

Experimental studies of scatter-probe near-field optical microscopy
Author(s): Saul Alonso Zavala Ortiz; Pedro Negrete-Regagnon; Eugenio R. Mendez
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Paper Abstract

Experiments with different types of near-field microscopes have demonstrated that the classical diffraction limit of conventional optical systems can be beaten. In these experiments, the resolution of the images is determined, primarily, by the size of the probe. One of these techniques consists of using scatterers in the near field of the sample. High resolutions have been demonstrated with this kind of scheme, although the signals are weak and the image formation is rather complex. Systematic studies are required to understand the properties and capabilities of the technique. Efforts are being made by many groups to understand the relation between the probe, the object and the image. In this work we present an experimental study of the image formation properties of different types of scatter-probe near-field optical microscopes.

Paper Details

Date Published: 30 October 1998
PDF: 5 pages
Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328442
Show Author Affiliations
Saul Alonso Zavala Ortiz, CICESE/Fisica Aplicada (Mexico)
Pedro Negrete-Regagnon, CICESE/Fisica Aplicada (Mexico)
Eugenio R. Mendez, CICESE/Fisica Aplicada (Mexico)

Published in SPIE Proceedings Vol. 3426:
Scattering and Surface Roughness II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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