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Proceedings Paper

CVD diamond wires and tips for x-ray detection: growth and characterization by SEM and micro-Raman spectroscopy
Author(s): Claudio Manfredotti; F. Fizzotti; A. Lo Giudice; G. Mucera; P. Polesello; Ettore Vittone; G. Mariotto; C. Vinegoni; E. Cazzanelli
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Paper Abstract

We present a systematic study of the growth of polycrystalline diamond thin films on W wires and tips by hot filament assisted chemical vapor deposition for x-ray detection purposes. We carry out correlations between scanning electron microscopy (SEM) observations and micro- Raman spectra, while varying different growth parameters. SEM observations show a uniform covering of the substrate, with growth rates ranging from 0.5 to 1.5 micrometers /h. All (mu) - R spectra show a well defined diamond peak at 1330.8-1333.7 cm-1 together with abroad structure at 1400-1600 cm-1 and a luminescence background extending over the whole scanned range. A close analysis shows that best quality is obtained with the lowest diameter substrates, at the lowest CH4 concentration and at a low pressure. Some depositions have been studied as x-ray detectors and their sensitivity at low energy and 6 MeV beam evaluated, showing a good response with respect to standard ionization chambers.

Paper Details

Date Published: 20 October 1998
PDF: 9 pages
Proc. SPIE 3484, Lasers in Synthesis, Characterization, and Processing of Diamond, (20 October 1998); doi: 10.1117/12.328207
Show Author Affiliations
Claudio Manfredotti, Univ. degli Studi di Torino (Italy)
F. Fizzotti, Univ. degli Studi di Torino (Italy)
A. Lo Giudice, Univ. degli Studi di Torino (Italy)
G. Mucera, Univ. degli Studi di Torino (Italy)
P. Polesello, Univ. degli Studi di Torino (Italy)
Ettore Vittone, Univ. degli Studi di Torino (Italy)
G. Mariotto, Univ. degli Studi di Trento (Italy)
C. Vinegoni, Univ. degli Studi di Trento (Italy)
E. Cazzanelli, Univ. della Calabria (Italy)


Published in SPIE Proceedings Vol. 3484:
Lasers in Synthesis, Characterization, and Processing of Diamond
Vitali I. Konov; Victor G. Ralchenko, Editor(s)

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