Share Email Print
cover

Proceedings Paper

NSF-supported undergraduate machine vision research activities
Author(s): John W. V. Miller; Malayappan Shridhar
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

For the past three summers, students at the University of Michigan-Dearborn have been participating in the development and testing of various aspects of machine vision systems with support from the National Science Foundation under the Research Experiences for Undergraduates (REU) program. Much of the work has involved algorithm development since useful work can be performed with a fairly modest programming background. Benchmarking of various algorithms is a related activity that has seen much student participation. To a lesser extent, illumination and optics work has also been performed for the development of experimental setups and actual implementation of vision systems. Over the three-year duration of the program, a total of 34 students participated in these activities. While many of the participants were full-time students at the University of Michigan-Dearborn, others were from engineering colleges over a diverse geographical area. Summaries of a number of the projects is included here. It may be noted that the National Science Foundation has established the REU program to encourage more students to obtain advanced degrees in science and engineering and ultimately to pursue careers in research and development.

Paper Details

Date Published: 6 October 1998
PDF: 5 pages
Proc. SPIE 3521, Machine Vision Systems for Inspection and Metrology VII, (6 October 1998); doi: 10.1117/12.326984
Show Author Affiliations
John W. V. Miller, Univ. of Michigan/Dearborn (United States)
Malayappan Shridhar, Univ. of Michigan/Dearborn (United States)


Published in SPIE Proceedings Vol. 3521:
Machine Vision Systems for Inspection and Metrology VII
Bruce G. Batchelor; John W. V. Miller; Susan Snell Solomon, Editor(s)

© SPIE. Terms of Use
Back to Top