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Proceedings Paper

Basic design principles of colorimetric vision systems
Author(s): Alex M. Mumzhiu
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Paper Abstract

Color measurement is an important part of overall production quality control in textile, coating, plastics, food, paper and other industries. The color measurement instruments such as colorimeters and spectrophotometers, used for production quality control have many limitations. In many applications they cannot be used for a variety of reasons and have to be replaced with human operators. Machine vision has great potential for color measurement. The components for color machine vision systems, such as broadcast quality 3-CCD cameras, fast and inexpensive PCI frame grabbers, and sophisticated image processing software packages are available. However the machine vision industry has only started to approach the color domain. The few color machine vision systems on the market, produced by the largest machine vision manufacturers have very limited capabilities. A lack of understanding that a vision based color measurement system could fail if it ignores the basic principles of colorimetry is the main reason for the slow progress of color vision systems. the purpose of this paper is to clarify how color measurement principles have to be applied to vision systems and how the electro-optical design features of colorimeters have to be modified in order to implement them for vision systems. The subject of this presentation far exceeds the limitations of a journal paper so only the most important aspects will be discussed. An overview of the major areas of applications for colorimetric vision system will be discussed. Finally, the reasons why some customers are happy with their vision systems and some are not will be analyzed.

Paper Details

Date Published: 6 October 1998
PDF: 5 pages
Proc. SPIE 3521, Machine Vision Systems for Inspection and Metrology VII, (6 October 1998); doi: 10.1117/12.326983
Show Author Affiliations
Alex M. Mumzhiu, CVSD, Inc. (United States)


Published in SPIE Proceedings Vol. 3521:
Machine Vision Systems for Inspection and Metrology VII
Bruce G. Batchelor; John W. V. Miller; Susan Snell Solomon, Editor(s)

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