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Proceedings Paper

Calibration of x-ray digital tomosynthesis system including the compensation for image distortion
Author(s): Young Jun Roh; Kuk Won Koh; Hyungsuck Cho; Jin-Young Kim; Hyung Cheol Kim; Jong-Eun Byun
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Paper Abstract

X-ray laminography and DT (digital tomosynthesis) are promising technologies to form a cross-section image of 3D objects and can be a good solution for inspection interior defects of industrial products. It has been known that digital tomosynthesis method has several advantages over laminography method in that it can overcome the problems such as blurring effect or artifact. The DT system consists of a scanning x-ray tube, an image intensifier as an x-ray image detector, and a CCD camera. To acquire an x-ray image of an arbitrary plane of objects, a set of images (8 images or more) should be synthesized by averaging or minimally calculating point by point. The images, however are distorted according to the configurations of the image intensifier and the x-ray source position. To get a clear and accurate synthesized image, the corresponding points in the distorted images should be accurately determined, and therefore, precise calibration of the DT system is needed to map the corresponding points correctly. In this work, a series of calibration methods for the DT system are presented including the correction of the center offset between the x-ray and the image intensifer, the x-ray steering calibration, and the correction of the distortion of the image. The calibration models are implemented to the DT system and the experiment results are presented and discussed in detail.

Paper Details

Date Published: 6 October 1998
PDF: 12 pages
Proc. SPIE 3521, Machine Vision Systems for Inspection and Metrology VII, (6 October 1998); doi: 10.1117/12.326966
Show Author Affiliations
Young Jun Roh, Korea Advanced Institute of Science and Technology (South Korea)
Kuk Won Koh, Korea Advanced Institute of Science and Technology (South Korea)
Hyungsuck Cho, Korea Advanced Institute of Science & Technology (South Korea)
Jin-Young Kim, Samsung Electronics Co., Ltd. (South Korea)
Hyung Cheol Kim, Samsung Electronics Co., Ltd. (South Korea)
Jong-Eun Byun, Samsung Electronics Co., Ltd. (South Korea)

Published in SPIE Proceedings Vol. 3521:
Machine Vision Systems for Inspection and Metrology VII
Bruce G. Batchelor; John W. V. Miller; Susan Snell Solomon, Editor(s)

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