Share Email Print
cover

Proceedings Paper

Numerical modeling of z-scans of thick nonlinear absorbers
Author(s): Anders Eriksson; Mikael Lindgren; Soren A. Svensson; Tim Bubner; Tim J. McKay; Jacqueline Staromlynska
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A numerical scheme for modeling of z-scans with samples ranging from thin samples to beyond the thick sample limit was introduced in our previous work (A. Eriksson et al., J. Opt. Soc. Am. B15, pp. 810-816, 1998). The method relies on a multilayer approach, where all layers are treated as independent, and may have different linear and nonlinear optical properties. The theoretical scheme can be used for irradiance as well as fluence, dependent absorbers. It allows for an arbitrarily shaped aperture in front of the detector. Here the method is tested and compared with the results of analytical thick sample theory and previously published numerical simulations. Ways of optimizing the performance of an optical limiting device are modeled and discussed. Preliminary experimental z-scan results of both thin and thick sample chloro-aluminum phthalocyanine were analyzed.

Paper Details

Date Published: 12 October 1998
PDF: 7 pages
Proc. SPIE 3472, Nonlinear Optical Liquids for Power Limiting and Imaging, (12 October 1998); doi: 10.1117/12.326883
Show Author Affiliations
Anders Eriksson, Linkoeping Univ. (Sweden)
Mikael Lindgren, Linkoeping Univ. and National Defence Research Establishment (Sweden)
Soren A. Svensson, National Defence Research Establishment (Sweden)
Tim Bubner, Defence Science and Technology Organisation (Australia)
Tim J. McKay, Defence Science and Technology Organisation (Australia)
Jacqueline Staromlynska, Defence Science and Technology Organisation (Australia)


Published in SPIE Proceedings Vol. 3472:
Nonlinear Optical Liquids for Power Limiting and Imaging
Christopher M. Lawson, Editor(s)

© SPIE. Terms of Use
Back to Top