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Proceedings Paper

Birefringence imaging with illumination-mode near-field scanning optical microscope
Author(s): Norihiro Umeda; Hitoshi Iijima; Motofusa Ishikawa; Atsuo Takayanagi
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Paper Abstract

A new optical configuration for a near field scanning optical polarized microscope with an illumination mode is reported. It uses two circularly polarized laser beams with different frequencies which are generated by an axial Zeeman laser. A laser beam is incident on an optical fiber and is launched form the apex of a sharpened fiber probe in order to illuminate the sample. The scattered light on the surface of the sample is collected with an objective lens and goes through the optical elements of the quarter wave plate and the linear polarizer. The light from polarization devices is converted to an electric signal with a photomultiplier and fed into a lock-in amplifier. The quarature components and intensity signal are acquired to computer, and the retardation and the azimuth angle of the birefringence are then calculated via computer. The measurement characteristic of the developed system and image of birefringence material are shown.

Paper Details

Date Published: 13 October 1998
PDF: 5 pages
Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); doi: 10.1117/12.326834
Show Author Affiliations
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)
Hitoshi Iijima, Tokyo Univ. of Agriculture and Technology (Japan)
Motofusa Ishikawa, Tokyo Univ. of Agriculture and Technology (Japan)
Atsuo Takayanagi, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 3467:
Far- and Near-Field Optics: Physics and Information Processing
Suganda Jutamulia; Toshimitsu Asakura, Editor(s)

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