Share Email Print
cover

Proceedings Paper

New approach to analysis of subwavelength-sized secondary light sources
Author(s): Nikolay B. Voznesensky; Vadim P. Veiko; Vitaly M. Domnenko; Alexey E. Goussev; Tatyana V. Ivanova; Sergey A. Rodionov
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A new approach to the investigation of probes for scanning near-field optical microscopes and recognition of parameters of arbitrary secondary light sources in nanometric scale is suggested. A new numerical technique of analytical continuation of the Fourier spectrum with the object restoration procedure based on Zernike polynomials iterative extrapolation is presented.

Paper Details

Date Published: 13 October 1998
PDF: 9 pages
Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); doi: 10.1117/12.326833
Show Author Affiliations
Nikolay B. Voznesensky, St. Petersburg State Institute for Fine Mechanics and Optics (Russia)
Vadim P. Veiko, St. Petersburg State Institute for Fine Mechanics and Optics (Russia)
Vitaly M. Domnenko, St. Petersburg State Institute for Fine Mechanics and Optics (Russia)
Alexey E. Goussev, St. Petersburg State Institute for Fine Mechanics and Optics (Russia)
Tatyana V. Ivanova, St. Petersburg State Institute for Fine Mechanics and Optics (Russia)
Sergey A. Rodionov, St. Petersburg State Institute for Fine Mechanics and Optics (Russia)


Published in SPIE Proceedings Vol. 3467:
Far- and Near-Field Optics: Physics and Information Processing
Suganda Jutamulia; Toshimitsu Asakura, Editor(s)

© SPIE. Terms of Use
Back to Top