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Proceedings Paper

Image resolution and contrast of a scanning near-field optical microscope: a review
Author(s): Tuan-Kay Lim
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Paper Abstract

In recent years, there have been intense efforts in the study of the physical principles and applications of the scanning near-field optical microscope. Extensive theoretical analyses, numerical simulations, and experimental investigations have been conducted. The results demonstrate that image resolution and contrast depends not only on the aperture size of the probe and the reflection/transmission of the sample, but also on other parameters and experimental conditions. In this paper, the influences of the operating mode, probe-sample interaction, polarization of light, and detector orientation are discussed. Furthermore, the progress on the use of linear systems transfer function for the characterization of image resolution is reviewed. Finally, future directions in research and development are discussed.

Paper Details

Date Published: 13 October 1998
PDF: 6 pages
Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); doi: 10.1117/12.326814
Show Author Affiliations
Tuan-Kay Lim, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 3467:
Far- and Near-Field Optics: Physics and Information Processing
Suganda Jutamulia; Toshimitsu Asakura, Editor(s)

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