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Proceedings Paper

Physics of laser action on surface and probe in intensive near field
Author(s): Mikhail N. Libenson; George A. Martsinovsky
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Paper Abstract

From the moment of its creation scanning near-field optical microscope (SNOM) has been attracting significant attention in the way of its application to superlocal optical action on objects. In fact, near-field radiator is a unique light source with dimensions smaller than the radiation wavelength. Using of such source in micro- and nanoelectronics, biology and other fields of science and technology extends potentialities of existing technologies. However, there are some principle physical and technical limitations of effective localization oflight action. Near-field radiator has to provide high power of the output radiation and its action has to be localized within as small region as possible. The highest transmission, that near-field probes have at the present time, is about iO — lOs. This means that with 10 mW input power coupled into the fiber probe and 50nm output aperture light power density at probe exit is about 41O- 4 lO W/cm2. Further increasing ofthe input power results in heating and destruction of the probe. This effect restricts efficiency of near-field action on surface. Localization of the near-field action on surface has, in turn, principle limitation related to the relaxation mechanism of absorbed light energy. Below these physical mechanisms that limit efficiency of near-field action are considered in details and possible ways of the efficiency increasing are discussed.

Paper Details

Date Published: 13 October 1998
PDF: 6 pages
Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); doi: 10.1117/12.326813
Show Author Affiliations
Mikhail N. Libenson, S.I. Vavilov State Optical Institute (Russia)
George A. Martsinovsky, S.I. Vavilov State Optical Institute (Russia)

Published in SPIE Proceedings Vol. 3467:
Far- and Near-Field Optics: Physics and Information Processing
Suganda Jutamulia; Toshimitsu Asakura, Editor(s)

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