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Proceedings Paper

Hybrid optoelectronic processing and computer vision techniques for intelligent debris analysis
Author(s): Adriana Dumitras; Faouzi Kossentini; Ali Jerbi; Q. M. Jonathan Wu; Chander Prakash Grover
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Paper Abstract

Intelligent Debris Analysis (IDA) requires significant time and resources due to the large number of images to be processed. To address this problem, we propose a hybrid optoelectronic and computer vision approach. Two major steps are involved for IDA: patch-level analysis and particle level analysis. An optoelectronic detection system using two ferroelectric liquid crystal spatial light modulators is designed and constructed to perform path-level analysis, and advanced computer vision techniques are developed to carry out more intelligent particle-level analysis. Since typically only a small portion of the debris filters require more sophisticated particle-level analysis, the proposed approach enables high-speed automated analysis of debris filters due to the inherent parallelism provided by the optoelectronic system.

Paper Details

Date Published: 9 October 1998
PDF: 10 pages
Proc. SPIE 3466, Algorithms, Devices, and Systems for Optical Information Processing II, (9 October 1998); doi: 10.1117/12.326773
Show Author Affiliations
Adriana Dumitras, Univ. of British Columbia (Canada)
Faouzi Kossentini, Univ. of British Columbia (Canada) (United States)
Ali Jerbi, National Research Council Canada (Canada)
Q. M. Jonathan Wu, National Research Council Canada (Canada)
Chander Prakash Grover, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 3466:
Algorithms, Devices, and Systems for Optical Information Processing II
Bahram Javidi; Demetri Psaltis, Editor(s)

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