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Proceedings Paper

Acousto-optic range Doppler processor for target discrimination
Author(s): Keith R. Frampton; Donald A. Coon; Michael J. Dorsett
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Paper Abstract

Essex has developed a hybrid acousto-optic/digital electronic processor, called the Advanced Optical Processor (AOP) a.k.a. Wideband Range-Doppler Imager (WRDI), that generates high dynamic range, high resolution range-Doppler images from wideband radar returns. This processor supports high resolution processing necessary for target discrimination and kill assessment. The processor is described and results of testing with simulated and real field data are presented. Key capabilities of this processor are: (1) high dynamic range to detect small cross section targets in a severe clutter background, (2) large image sizes in multiples of 1024 range bins by up to 128 Doppler resolution bins, (3) dynamically adjustable Doppler resolution, (4) dynamic reconfigurability of modules to switch between coarse range resolution covering a large range extent for acquisition mode to a fine resolution mode for target discrimination, (5) the ability to accommodate time compression/dilation to eliminate blurring of moving targets in high resolution range-Doppler images, and (6) the ability to efficiently combine multiple low bandwidth, low range resolution radar returns to obtain high range resolution range-Doppler images. The AOP can process true arbitrary waveforms, which are needed to support the high dynamic range required for discrimination. This is achieved in a compact, light weight and cost effective package.

Paper Details

Date Published: 14 October 1998
PDF: 12 pages
Proc. SPIE 3462, Radar Processing, Technology, and Applications III, (14 October 1998); doi: 10.1117/12.326765
Show Author Affiliations
Keith R. Frampton, Essex Corp. (United States)
Donald A. Coon, Essex Corp. (United States)
Michael J. Dorsett, U.S. Army Space and Missile Defense Command (United States)

Published in SPIE Proceedings Vol. 3462:
Radar Processing, Technology, and Applications III
William J. Miceli, Editor(s)

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