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Proceedings Paper

Characterization of high-OD ultrathin infrared neutral density filters
Author(s): Simon G. Kaplan; Leonard M. Hanssen; Alan L. Migdall; Glenn Lefever-Button
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Paper Abstract

We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 micrometer and 10.6 micrometer) systems. The use of ultrathin substrates, free of etaloning effects over the 2 micrometer to 20 micrometer spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.

Paper Details

Date Published: 8 October 1998
PDF: 8 pages
Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326679
Show Author Affiliations
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Leonard M. Hanssen, National Institute of Standards and Technology (United States)
Alan L. Migdall, National Institute of Standards and Technology (United States)
Glenn Lefever-Button, Luxel Corp. (United States)


Published in SPIE Proceedings Vol. 3425:
Optical Diagnostic Methods for Inorganic Transmissive Materials
Raju V. Datla; Leonard M. Hanssen, Editor(s)

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