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Proceedings Paper

Far-ultraviolet refractive index of optical materials for solar blind channel (SBC) filters for the HST advanced camera for surveys (ACS)
Author(s): Douglas B. Leviton; Timothy J. Madison; Peter Petrone
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Paper Abstract

Refractive index measurements using the minimum deviation method have been carried out for prisms of a variety of far ultraviolet optical materials used in the manufacture of Solar Blind Channel (SBC) filters for the HST Advanced Camera for Surveys (ACS). Some of the materials measured are gaining popularity in a variety of high technology applications including high power excimer lasers and advanced microlithography optics operating in a wavelength region where high quality knowledge of optical material properties is sparse yet critical. Our measurements are of unusually high accuracy and precision for this wavelength region owing to advanced instrumentation in the large vacuum chamber of the Diffraction Grating Evaluation Facility (DGEF) at Goddard Space Flight Center (GSFC) used to implement a minimum deviation method refractometer. Index values for CaF2, BaF2, LiF, and far ultraviolet grades of synthetic sapphire and synthetic fused silica are reported and compared with values from the literature.

Paper Details

Date Published: 8 October 1998
PDF: 12 pages
Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326675
Show Author Affiliations
Douglas B. Leviton, NASA Goddard Space Flight Ctr. (United States)
Timothy J. Madison, NASA Goddard Space Flight Ctr. (United States)
Peter Petrone, NSI Technical Services (United States)


Published in SPIE Proceedings Vol. 3425:
Optical Diagnostic Methods for Inorganic Transmissive Materials
Raju V. Datla; Leonard M. Hanssen, Editor(s)

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