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Proceedings Paper

Methods for absolute reflectance measurement of transmissive materials in the infrared
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Paper Abstract

Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the 'V-W,' 'V-N,' and goniometer based methods, have been in use for a number of years. The fourth is an integrating sphere method. The sphere system is used for both specular and diffuse samples but achieves its greatest accuracy in the measurement of specular reflectance and transmittance. A direct comparison of the sphere and goniometer methods is made on samples in the infrared spectral region.

Paper Details

Date Published: 8 October 1998
PDF: 12 pages
Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326674
Show Author Affiliations
Leonard M. Hanssen, National Institute of Standards and Technology (United States)
Simon G. Kaplan, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3425:
Optical Diagnostic Methods for Inorganic Transmissive Materials
Raju V. Datla; Leonard M. Hanssen, Editor(s)

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