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Proceedings Paper

Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared
Author(s): Douglas B. Leviton; Timothy J. Madison; Peter Petrone
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Paper Abstract

The focal shift of an optical filter used in non-collimated light depends directly on substrate thickness and index of refraction. The HST Advanced Camera for Surveys (ACS) requires a set of filters whose focal shifts are tightly matched. Knowing the index of refraction for substrate glasses allows precise substrate thicknesses to be specified. Two refractometers have been developed at the Goddard Space Flight Center (GSFC) to determine the indices of refraction of materials from which ACS filters are made. Modern imaging detectors for the near infrared, visible, and far ultraviolet spectral regions make these simple yet sophisticated refractometers possible. A new technology, high accuracy, angular encoder also developed at GSFC makes high precision index measurement possible in the vacuum ultraviolet by prism methods.

Paper Details

Date Published: 8 October 1998
PDF: 12 pages
Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326672
Show Author Affiliations
Douglas B. Leviton, NASA Goddard Space Flight Ctr. (United States)
Timothy J. Madison, NASA Goddard Space Flight Ctr. (United States)
Peter Petrone, NSI Technical Services (United States)


Published in SPIE Proceedings Vol. 3425:
Optical Diagnostic Methods for Inorganic Transmissive Materials
Raju V. Datla; Leonard M. Hanssen, Editor(s)

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