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Proceedings Paper

Fourier transform refractometry
Author(s): Simon G. Kaplan; Leonard M. Hanssen; Ulf Griesmann; Rajeev Gupta
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Paper Abstract

We describe instrumentation that has been constructed at the National Institute of Standards and Technology (NIST) for measurement of the index of refraction of solid materials in the spectral region from 0.5 micrometer to 1000 micrometer using Fourier-transform based spectrophotometers and etalon samples. Preliminary index of refraction measurements have been performed on fused silica and arsenic trisulfide glass samples from 0.5 micrometer to 12 micrometer, and the results are compared to tabulated values on these materials.

Paper Details

Date Published: 8 October 1998
PDF: 10 pages
Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326666
Show Author Affiliations
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Leonard M. Hanssen, National Institute of Standards and Technology (United States)
Ulf Griesmann, National Institute of Standards and Technology (United States)
Rajeev Gupta, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3425:
Optical Diagnostic Methods for Inorganic Transmissive Materials
Raju V. Datla; Leonard M. Hanssen, Editor(s)

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