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Proceedings Paper

Intercomparisons of reflectance measurements
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Paper Abstract

A comparison of spectral diffuse reflectance between different national standards laboratories is being planned under the direction of the Comite Consultatif de Photometrie et Radiometrie (CCPR). A similar comparison of bidirectional reflectance distribution factor among laboratories in the United States in support of optical remote sensing measurements is nearing completion. Since this comparison provides valuable lessons for the one organized by the CCPR, pertinent results and their implications are presented.

Paper Details

Date Published: 8 October 1998
PDF: 6 pages
Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326663
Show Author Affiliations
Patricia Yvonne Barnes, National Institute of Standards and Technology (United States)
Edward A. Early, National Institute of Standards and Technology (United States)
B. Carol Johnson, National Institute of Standards and Technology (United States)
James J. Butler, NASA Goddard Space Flight Ctr. (United States)
Carol J. Bruegge, Jet Propulsion Lab. (United States)
Stuart F. Biggar, Optical Sciences Ctr./Univ. of Arizona (United States)
Paul R. Spyak, Optical Sciences Ctr./Univ. of Arizona (United States)
Milutin M. Pavlov, Hughes Santa Barbara Remote Sensing/Raytheon Co. (United States)


Published in SPIE Proceedings Vol. 3425:
Optical Diagnostic Methods for Inorganic Transmissive Materials
Raju V. Datla; Leonard M. Hanssen, Editor(s)

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