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Proceedings Paper

Characterization of the optical nonlinearities of ZnSe using Z-scan techniques
Author(s): Martin Boulanger; Alain Villeneuve; Michel Piche
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Paper Abstract

We report on the measurements of the nonlinear susceptibility of ZnSe at 783 nm with 110 fs pulses of various intensities. We point out limitations for the measurement of (chi) (5) nonlinear susceptibility using Z- scan technique. We also present a new technique using self- imaging (SIZ-scan) which could provide more sensitive measurements of nonlinear refractive effects.

Paper Details

Date Published: 9 October 1998
PDF: 8 pages
Proc. SPIE 3418, Advances in Optical Beam Characterization and Measurements, (9 October 1998); doi: 10.1117/12.326646
Show Author Affiliations
Martin Boulanger, COPL/Univ. Laval (Canada)
Alain Villeneuve, COPL/Univ. Laval (Canada)
Michel Piche, COPL/Univ. Laval (Canada)

Published in SPIE Proceedings Vol. 3418:
Advances in Optical Beam Characterization and Measurements
Michel Piche, Editor(s)

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