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Proceedings Paper

Optical characterization of linear and nonlinear materials using Bessel beams
Author(s): Brigitte Belanger; Pierre-Yves Fortin; Narine Tovmasyan; Michel Piche
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Paper Abstract

We first recall that Bessel beams (or `diffraction-free beams') can be produced by a Fourier optics setup where a mask with concentric transmission rings is placed at the focus of a lens. We then describe how the coherent superposition of Bessel beams with proper spatial frequencies leads to a self-imaging phenomenon. Such a behavior can be exploited to measure the curvature of the wavefront incident on the mask used to generate the Bessel beams. It is shown, theoretically and experimentally, that a parabolic phase variation along the radial coordinate for the beam incident on the mask translates into an image shift along the propagation axis. That result can be exploited for the measurement of surface deformation and for the characterization of the optical nonlinearities of materials. We also report on a procedure to optimize the sensitivity of the method.

Paper Details

Date Published: 9 October 1998
PDF: 9 pages
Proc. SPIE 3418, Advances in Optical Beam Characterization and Measurements, (9 October 1998); doi: 10.1117/12.326640
Show Author Affiliations
Brigitte Belanger, COPL/Univ. Laval (Canada)
Pierre-Yves Fortin, COPL/Univ. Laval (Canada)
Narine Tovmasyan, COPL/Univ. Laval (Canada)
Michel Piche, COPL/Univ. Laval (Canada)

Published in SPIE Proceedings Vol. 3418:
Advances in Optical Beam Characterization and Measurements
Michel Piche, Editor(s)

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