Share Email Print
cover

Proceedings Paper

Fault diagnosis of CMOS LSI with various leakage current state using abnormal IDDQ phenomenon
Author(s): Masaru Sanada; Hiromu Fujioka
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Abnormal IDDQ is the signal to indicate the presence of physical damage in a circuit. By using this phenomenon, a CAD-based fault diagnosis technique has been developed for CMOS-LSI with various leakage current state. This method of progressively reducing the faulty block works by extracting inner logic state of each block, which composes hierarchical circuit and LSI circuit, from logic simulation and by deriving test vector numbers with abnormal IDDQ. Two kinds of complex leakage state are abnormal state of LSI with penetration current from VDD to GND in normal state and with multiple faults. At the former state, test vector numbers with true abnormal IDDQ are extracted by subtracting operation between normal and unusual current value, and the latter, by classification of multiple values. The fundamental diagnosis technique employs the comparative operation of each block to determine whether the same input logic state with abnormal IDDQ exists in the input logic state with normal IDDQ or not. The former block is regarded as normal block and the latter is as faulty block. This diagnosis method for LSI with various leakage current state detects easily the faulty blocks of each abnormal IDDQ state.

Paper Details

Date Published: 28 August 1998
PDF: 10 pages
Proc. SPIE 3510, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV, (28 August 1998); doi: 10.1117/12.324376
Show Author Affiliations
Masaru Sanada, NEC Corp. and Osaka Univ. (Japan)
Hiromu Fujioka, Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 3510:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV
Sharad Prasad; Hans-Dieter Hartmann; Tohru Tsujide, Editor(s)

© SPIE. Terms of Use
Back to Top