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Proceedings Paper

When is a feature really there: the SiZer approach
Author(s): J. Stephen Marron; Probal Chaudhuri
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Paper Abstract

Statistical smoothing methods are useful for finding important and nonobvious structure in data. However, some of the features discovered in this way can be spurious sampling artifacts. The SiZer approach (based on studying statistical SIgnificance of ZERo crossings of smoothed estimates) to analyzing which visible features represent important underlying structures, is discussed.

Paper Details

Date Published: 18 September 1998
PDF: 7 pages
Proc. SPIE 3371, Automatic Target Recognition VIII, (18 September 1998); doi: 10.1117/12.323850
Show Author Affiliations
J. Stephen Marron, Univ. of North Carolina/Chapel Hill (United States)
Probal Chaudhuri, Indian Statistical Institute (India)

Published in SPIE Proceedings Vol. 3371:
Automatic Target Recognition VIII
Firooz A. Sadjadi, Editor(s)

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