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Proceedings Paper

Defect recognition algorithm based on direction curve in x-ray photos
Author(s): Hua Li; Jianguo Liu
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Paper Abstract

A new recognition algorithm using composite operator and direction curves to auto-detect the dreg defects in x-rays photo is proposed in this paper. This algorithm is simple with little computation, fast detection speed, good effect of real-time process, high accuracy of detection and good adaptability. Experiments evince this algorithm is a good feature detection method.

Paper Details

Date Published: 25 September 1998
PDF: 4 pages
Proc. SPIE 3545, International Symposium on Multispectral Image Processing (ISMIP'98), (25 September 1998); doi: 10.1117/12.323552
Show Author Affiliations
Hua Li, Huazhong Univ. of Science and Technology (China)
Jianguo Liu, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 3545:
International Symposium on Multispectral Image Processing (ISMIP'98)
Ji Zhou; Anil K. Jain; Tianxu Zhang; Yaoting Zhu; Mingyue Ding; Jianguo Liu, Editor(s)

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