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Proceedings Paper

IR ellipsometry for surface anisotropy measurement: applications to pulp and paper industry
Author(s): Pierre Bernard; Alain Charlebois
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Paper Abstract

Uniformity of physical properties of paper continues to be one of the most serious quality issues in today's paper mills. The large-scale `average' profile can often be controlled effectively with today's technologies. However, to detect and control sizes from several microns to a few centimeters remains the industry's biggest challenge. Over the last several years, INO has developed and perfected an entirely new instrument to measure surface fiber orientation. This non-destructive, non-contact technique can more appropriately be described as a surface strain tester. It is slowly finding its way in various laboratories around the world, notably Sweden, United States and France. The instrument uses a custom designed phase-modulated, laser- based ellipsometer in the far infrared spectral region. It basically measures the local surface birefringence and direction of the optic axis. Our approach is highly unusual since it works for samples of widely varying surface roughness and does not require careful alignment of the sample with respect to the laser beam. This paper describes how the instrument works, what it measures and illustrates various applications from small scale mapping to cross- machine profiles.

Paper Details

Date Published: 24 September 1998
PDF: 7 pages
Proc. SPIE 3414, Opto-Contact: Workshop on Technology Transfers, Start-Up Opportunities,and Strategic Alliances, (24 September 1998); doi: 10.1117/12.323538
Show Author Affiliations
Pierre Bernard, INO--Institut National d'Optique (Canada)
Alain Charlebois, INO--Institut National d'Optique (Canada)


Published in SPIE Proceedings Vol. 3414:
Opto-Contact: Workshop on Technology Transfers, Start-Up Opportunities,and Strategic Alliances
Robert J. L. Corriveau; M. J. Soileau; Michel Auger, Editor(s)

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