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Proceedings Paper

Fourier transform infrared spectrometry: a mature analytical method for industrial-level emission monitoring
Author(s): Daniel Gravel; Allan Rilling; Henry L. Buijs; Vlastimil Karfik
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Paper Details

Date Published: 24 September 1998
PDF: 7 pages
Proc. SPIE 3414, Opto-Contact: Workshop on Technology Transfers, Start-Up Opportunities,and Strategic Alliances, (24 September 1998); doi: 10.1117/12.323530
Show Author Affiliations
Daniel Gravel, BOMEM Inc. (Canada)
Allan Rilling, BOMEM Inc. (Canada)
Henry L. Buijs, BOMEM Inc. (Canada)
Vlastimil Karfik, Hartmann & Braun (Germany)


Published in SPIE Proceedings Vol. 3414:
Opto-Contact: Workshop on Technology Transfers, Start-Up Opportunities,and Strategic Alliances
Robert J. L. Corriveau; M. J. Soileau; Michel Auger, Editor(s)

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