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Proceedings Paper

Adaptive system for speckle pattern interferometry
Author(s): Janos Kornis; Attila Nemeth; Nasser Moustafa
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Paper Abstract

In our paper we have analyzed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The core of this technique is the using of the holographically reconstructed virtual images of reference waves. Using this solution an adaptive measuring system can be built. A developed prototype of the ASPI has been presented as a measuring device for various measuring tasks. Selected applications have been shown from real time holography to comparative displacement or contour measurement.

Paper Details

Date Published: 29 September 1998
PDF: 6 pages
Proc. SPIE 3407, International Conference on Applied Optical Metrology, (29 September 1998); doi: 10.1117/12.323323
Show Author Affiliations
Janos Kornis, Technical Univ. of Budapest (Hungary)
Attila Nemeth, Technical Univ. of Budapest (Hungary)
Nasser Moustafa, Technical Univ. of Budapest (Hungary)

Published in SPIE Proceedings Vol. 3407:
International Conference on Applied Optical Metrology
Pramod Kumar Rastogi; Ferenc Gyimesi, Editor(s)

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