Share Email Print

Proceedings Paper

Optomechanical microprobe system for measuring very small parts on CMMs
Author(s): Guijun Ji; Heinrich Iven Schwenke; Eugen Trapet
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

An opto-mechanical microprobe system which combines the advantages of optical non-contact method and mechanical contact one is proposed for measuring very small parts on coordinate measuring machines. The principle is based on the evaluation of a central position of stylus ball by an optical system, the stylus ball is illuminated by a cold light source through an optical fiber. The most inventive advantage of the microprobe is that the deformation of its stylus does not influence the measuring results, so the stylus could be extremely thin. Until now an opto-mechanical microprobe with stylus ball of diameter of about 40 micrometers and stylus of diameter of about 20 micrometers is developed. Experiments show that the accuracy of the opto-mechanical microprobe is better than 1 micrometers and the measuring force is less than 10 (mu) N.

Paper Details

Date Published: 2 October 1998
PDF: 6 pages
Proc. SPIE 3454, Vision Geometry VII, (2 October 1998); doi: 10.1117/12.323273
Show Author Affiliations
Guijun Ji, Tianjin Univ. (United States)
Heinrich Iven Schwenke, Physikalisch-Technische Bundesanstalt (Germany)
Eugen Trapet, Physikalisch-Technische Bundesanstalt (Germany)

Published in SPIE Proceedings Vol. 3454:
Vision Geometry VII
Robert A. Melter; Angela Y. Wu; Longin Jan Latecki, Editor(s)

© SPIE. Terms of Use
Back to Top