Share Email Print
cover

Proceedings Paper

Fit of Edlen formulae to measure values of the refractive index of air
Author(s): Gerhard Boensch; Eckhard Potulski
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

For accurate interferometric length measurements, the accurately determined value of the refractive index of air is required. In many cases the refractive index is evaluated from measured air parameters. A widely applied set of formulae for this evaluation has been provided by Edlen who fitted existing experimental data. Modified Edlen's formulae are presented which were fitted to values obtained by an air refractometer situated in an environmental chamber. This chamber allows stabilization of the air parameters. A new series of measurements has been performed with three laser wavelengths at 543 nm, 633 nm, and 780 nm and good agreement with the results previously reported has been obtained.

Paper Details

Date Published: 30 September 1998
PDF: 6 pages
Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); doi: 10.1117/12.323125
Show Author Affiliations
Gerhard Boensch, Physikalisch-Technische Bundesanstalt (Germany)
Eckhard Potulski, Physikalisch-Technische Bundesanstalt (Germany)


Published in SPIE Proceedings Vol. 3477:
Recent Developments in Optical Gauge Block Metrology
Jennifer E. Decker; Nicholas Brown, Editor(s)

© SPIE. Terms of Use
Back to Top