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Proceedings Paper

Measurement of a correction for the phase change on reflection due to surface roughness
Author(s): Richard K. Leach
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Paper Abstract

A system has been developed at the National Physics Laboratory that measures a correction for the phase change on reflection due to surface roughness when measuring the length of a gauge block by optical interferometry. The system uses an integrating sphere and photodetectors to measure the intensity of the light that is both diffusely and specularly reflected at a surface. From these intensities the system calculates a surface roughness parameter that is proportional to the phase change on reflection due to surface roughness. The operating principle of the system along with the uncertainties and bandwidth limitations of an integrating sphere are discussed. An interferometric system has also been developed to calibrate the integrating sphere method, but it was found that effects due to wringing caused such high uncertainties that it was necessary to use the well-established phase stack method instead. The new method is quick and easy to use and measures a roughness correction for every gauge in a set.

Paper Details

Date Published: 30 September 1998
PDF: 14 pages
Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); doi: 10.1117/12.323103
Show Author Affiliations
Richard K. Leach, National Physical Lab. (United Kingdom)


Published in SPIE Proceedings Vol. 3477:
Recent Developments in Optical Gauge Block Metrology
Jennifer E. Decker; Nicholas Brown, Editor(s)

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