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Proceedings Paper

Portable I2-stabilized Nd:YAG laser for wavelength standards at 532 nm and 1064 nm
Author(s): Feng-Lei Hong; Jun Ishikawa; Tai Hyun Yoon; Long-Sheng Ma; Jun Ye; John L. Hall
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Paper Abstract

We have established a portable I2-stabilized Nd:YAG laser for the purpose of making wavelength standards at 532 nm and 1064 nm. All the optical parts of the laser systems were arranged on a 45 cm X 45 cm breadboard. The system was transported from NRLM to JILA for frequency comparison. The results of the comparison show that the Allan Variance of the portable laser reached < 3 X 10-13 when the integration time (tau) is larger than 100 s. The frequency differences between the NRLM and JILA lasers during 3-day measurements were consistent within +/- 35 Hz, but the matrix-averaged standard deviation of about 310 Hz, and offset are regarded as not yet fully satisfactory. The stability of the portable laser was further improved to about 3 X 10-14 by using a longer iodine cell and several frequency stabilization techniques.

Paper Details

Date Published: 30 September 1998
PDF: 9 pages
Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); doi: 10.1117/12.323092
Show Author Affiliations
Feng-Lei Hong, National Research Lab. of Metrology (Japan)
Jun Ishikawa, National Research Lab. of Metrology (Japan)
Tai Hyun Yoon, National Research Lab. of Metrology (Japan) (South Korea)
Long-Sheng Ma, National Institute of Standards and Technology and Univ. of Colorado/Boulder (United States)
Jun Ye, National Institute of Standards and Technology (United States)
John L. Hall, National Institute of Standards and Technology and Univ. of Colorado/Boulder (United States)


Published in SPIE Proceedings Vol. 3477:
Recent Developments in Optical Gauge Block Metrology
Jennifer E. Decker; Nicholas Brown, Editor(s)

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