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Proceedings Paper

Sensitivity of AsxSe100-x thin films for electron-beam irradiation
Author(s): Nina Nordman; Olli Nordman; Nasser Peyghambarian
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Paper Abstract

Recently we have reported on the influence of the electron beam on As2S3 thin films. However, the sensitivity of the AsxSe100-x thin films with different compositions has not been investigated. Here we report on our measurement of the index change of AsxSe100-x thin films for the construction of the graded index optical components.

Paper Details

Date Published: 21 September 1998
PDF: 7 pages
Proc. SPIE 3482, International Optical Design Conference 1998, (21 September 1998); doi: 10.1117/12.321982
Show Author Affiliations
Nina Nordman, Optical Sciences Ctr./Univ. of Arizona (United States)
Olli Nordman, Optical Sciences Ctr./Univ. of Arizona (United States)
Nasser Peyghambarian, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 3482:
International Optical Design Conference 1998
Leo R. Gardner; Kevin P. Thompson, Editor(s)

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