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Proceedings Paper

Recognizing articulated objects and object articulation in SAR images
Author(s): Bir Bhanu; Grinnell Jones; Joon S. Ahn
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Paper Abstract

The focus of this paper is recognizing articulated objects and the pose of the articulated parts in SAR images. Using SAR scattering center locations as features, the invariance with articulation (i.e. turret rotation for the T72, T80 and M1a tanks, missile erect vs. down for the SCUD launcher) is shown as a function of object azimuth. Similar data is shown for configuration differences in the MSTAR (Public) Targets. The UCR model-based recognition engine (which uses non- articulated models to recognize articulated, occluded and non-standard configuration objects) is described and target identification performance results are given as confusion matrices and ROC curves for six inch and one foot resolution XPATCH images and the one foot resolution MSTAR data. Separate body and turret models are developed that are independent of the relative positions between the body and the turret. These models are used with a subsequent matching technique to refine the pose of the body and determine the pose of the turret. An expression of the probability that a random match will occur is derived and this function is used to set thresholds to minimize the probability of a random match for the recognition system. Results for identification, body pose and turret pose are presented as a function of percent occlusion for articulated XPATCH data and results are given for identification and body pose for articulated MSTAR data.

Paper Details

Date Published: 15 September 1998
PDF: 13 pages
Proc. SPIE 3370, Algorithms for Synthetic Aperture Radar Imagery V, (15 September 1998); doi: 10.1117/12.321852
Show Author Affiliations
Bir Bhanu, Univ. of California/Riverside (United States)
Grinnell Jones, Univ. of California/Riverside (United States)
Joon S. Ahn, Univ. of California/Riverside (United States)


Published in SPIE Proceedings Vol. 3370:
Algorithms for Synthetic Aperture Radar Imagery V
Edmund G. Zelnio, Editor(s)

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