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Proceedings Paper

Device reliability issues in field emission displays
Author(s): Babu Chalamala; Robert H. Reuss; Troy A. Trottier; Cecil W. Penn; Yi Wei
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Paper Abstract

Field emission displays are currently making the transition from R&D into prototypes and early production. Device reliability is a critical issue in realization of successful field emission displays that are able to compete with other established technologies like active matrix liquid crystal displays and thin film electroluminescent displays. In this paper, we review the fundamental issues affecting the reliability and operational life of field emission display systems.

Paper Details

Date Published: 14 September 1998
PDF: 8 pages
Proc. SPIE 3363, Cockpit Displays V: Displays for Defense Applications, (14 September 1998); doi: 10.1117/12.321806
Show Author Affiliations
Babu Chalamala, Motorola (United States)
Robert H. Reuss, Motorola (United States)
Troy A. Trottier, Motorola (United States)
Cecil W. Penn, Motorola (United States)
Yi Wei, Motorola (United States)


Published in SPIE Proceedings Vol. 3363:
Cockpit Displays V: Displays for Defense Applications
Darrel G. Hopper, Editor(s)

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