Share Email Print
cover

Proceedings Paper

Optimization of high-power excimer laser for TFT annealing
Author(s): Heinrich Endert; Bruno Becker-de Mos; Uwe Stamm; Stefan Borneis; Frank Voss; Dirk Basting
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The flat panel display market is presently experiencing an annual growth rate of over 20%, and shows no signs of slowing down. Polycrystalline-silicon (poly-Si) thin film transistor (TFT) devices offer both improved quality and decreased cost over amorphous silicon displays, and will undoubtedly capture an ever increasing share of this market. However, producing poly-Si TFTs in high volume has presented a number of practical challenges. One of these challenges is transforming an amorphous silicon layer into poly-Si. For several years, researchers have investigated using excimer lasers for this purpose. In excimer laser annealing, a high-power excimer laser beam is scanned across the surface of a substrate coated with amorphous silicon. The intense UV light causes the silicon to melt, leading to subsequent recrystallization in polycrystalline form. This process is very non-linear, and places tight tolerances on laser beam parameters such as energy stability and beam uniformity. Furthermore, for this technique to be successfully integrated into a high volume production line, the laser must exhibit extremely high reliability, minimum downtime and low cost of ownership. In the past few years, excimer laser manufacturers have made significant technical improvements, leading to products that can successfully meet the rigorous demands of industrial TFT production. As a result, major display manufacturers in Japan, Korea and Europe have now adopted this technology for mass production.

Paper Details

Date Published: 14 September 1998
PDF: 8 pages
Proc. SPIE 3343, High-Power Laser Ablation, (14 September 1998); doi: 10.1117/12.321581
Show Author Affiliations
Heinrich Endert, Lambda Physik, Inc. (United States)
Bruno Becker-de Mos, Lambda Physik Lasertechnik GmbH (Germany)
Uwe Stamm, Lambda Physik Lasertechnik GmbH (Germany)
Stefan Borneis, Lambda Physik Lasertechnik GmbH (United States)
Frank Voss, Lambda Physik Lasertechnik GmbH (Germany)
Dirk Basting, Lambda Physik Lasertechnik GmbH (United States)


Published in SPIE Proceedings Vol. 3343:
High-Power Laser Ablation
Claude R. Phipps, Editor(s)

© SPIE. Terms of Use
Back to Top