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Proceedings Paper

Optical peculiarities of thin absorbing films
Author(s): Tamara A. Kudykina
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Paper Abstract

Optical parameters of thin semiconductor films in visible region are investigated with two different methods: use the new analogues of Fresnel's formulas for absorbing media for calculation of reflection and transmission and, use the calculation of an index of refraction on a base of a phase change on reflection. Results of these methods agree well. Thickness dependencies of n(d) and k(d) of Ge, Si, Se, Te were obtained for the experimental data. Curves n(d) have resonance maxima at thicknesses, which are less than light wavelength in a medium in (pi) times. Curves k(d) in this region have minima or even change their signs showing that both absorption and spontaneous emission of light take place. In the limit d yields 0, n(d) trends to unity.

Paper Details

Date Published: 19 August 1998
PDF: 4 pages
Proc. SPIE 3573, OPTIKA '98: 5th Congress on Modern Optics, (19 August 1998); doi: 10.1117/12.320957
Show Author Affiliations
Tamara A. Kudykina, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 3573:
OPTIKA '98: 5th Congress on Modern Optics
Gyorgy Akos; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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